Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10539589 | Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing | Vladimir A. Ukraintsev, Ronen Benzion | 2020-01-21 |
| 8553322 | Variable magnification optics with spray cooling | Prasad Sabbineni, Thomas Kujawa | 2013-10-08 |
| 6956365 | System and method for calibration of testing equipment using device photoemission | Steven Kasapi | 2005-10-18 |
| 4941980 | System for measuring a topographical feature on a specimen | Uriel Halavee, Tzila Schwarzkopf | 1990-07-17 |