Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

US Patent 7400154 · Granted Jul 15, 2008

Estimated economic value: $2,561,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for testing an integrated circuit2021
Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and2021
High frequency lock-in thermography using single photon detectors2020
Method of controlling a calculation device via a mobile element and control syst2019
Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and2019
Method and installation for exposing the surface of an integrated circuit2013
Wind-powered device for producing electrical energy2013
Method of analyzing an integrated circuit, method of observation and their assoc2012
FIB milling of copper over organic dielectrics2011
Apparatus and method for optical interference fringe based integrated circuit pr2011
Methods and systems of performing device failure analysis, electrical characteri2010
FIB based open via analysis and repair2010