Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | Roger Alvis, Laurens Franz Taemsz Kwakman, Tomas Vystavel | 2022-11-29 |
| 7453274 | Detection of defects using transient contrast | Lei Zhong, Kara L. Sherman, Robert W. Fiordalice | 2008-11-18 |