MU

Mark W. Utlaut

FE Fei: 37 patents #2 of 681Top 1%
HA Hughes Aircraft: 5 patents #308 of 2,963Top 15%
OC Oregon Graduate Center: 1 patents #8 of 26Top 35%
UE US Dept of Energy: 1 patents #1,355 of 5,099Top 30%
VA Varian: 1 patents #283 of 684Top 45%
Overall (All Time): #68,181 of 4,157,543Top 2%
44
Patents All Time

Issued Patents All Time

Showing 25 most recent of 44 patents

Patent #TitleCo-InventorsDate
10493559 Method and apparatus for laser machining Marcus Straw, David H. Narum, Milos Toth, Guido Knippels, Gerardus N. A. Van Veen 2019-12-03
10366860 High aspect ratio X-ray targets and uses of same N. William Parker, Laurens Franz Taemsz Kwakman, Thomas G. Miller 2019-07-30
9934930 High aspect ratio x-ray targets and uses of same N. William Parker, Laurens Franz Taemsz Kwakman, Thomas G. Miller 2018-04-03
9733164 Lamella creation method and device using fixed-angle beam and rotating sample stage Andrew B. Wells, N. William Parker, Clive D. Chandler 2017-08-15
9591735 High voltage isolation of an inductively coupled plasma ion source with a liquid that is not actively pumped Sean Kellogg, Andrew B. Wells, James B. McGinn, N. William Parker 2017-03-07
9530625 Method for attachment of an electrode into an inductively-coupled plasma Sean Kellogg, Anthony Graupera, William Parker, Andrew B. Wells, Walter Skoczylas +3 more 2016-12-27
9494516 System and method for simultaneous detection of secondary electrons and light in a charged particle beam system N. William Parker 2016-11-15
9478390 Integrated light optics and gas delivery in a charged particle lens N. William Parker, Marcus Straw, Jorge Filevich, Aurelien Philippe Jean Maclou Botman, Steven Randolph +1 more 2016-10-25
9401262 Multi-source plasma focused ion beam system Noel Smith, Clive D. Chandler, Paul P. Tesch, David William Tuggle 2016-07-26
9204036 Image-enhancing spotlight mode for digital microscopy Alan Bahm, N. William Parker 2015-12-01
9159534 Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Anthony Graupera, Sean Kellogg, N. William Parker 2015-10-13
9053895 System for attachment of an electrode into a plasma source Sean Kellogg, Anthony Graupera, N. William Parker, Andrew B. Wells, Walter Skoczylas +3 more 2015-06-09
9044781 Microfluidics delivery systems Aurelien Philippe Jean Maclou Botman, Steven Randolph 2015-06-02
9040909 System and method for simultaneous detection of secondary electrons and light in a charged particle beam system N. William Parker 2015-05-26
9029812 Multi-source plasma focused ion beam system Noel Smith, Clive D. Chandler, Paul P. Tesch, David William Tuggle 2015-05-12
8987678 Encapsulation of electrodes in solid media Sean Kellogg, N. William Parker, Anthony Graupera 2015-03-24
8907296 Charged particle beam system aperture N. William Parker, David William Tuggle, Jeremy Graham 2014-12-09
8853592 Method for laser machining a sample having a crystalline structure Marcus Straw, Amin Samsavar, Milos Toth 2014-10-07
8759764 On-axis detector for charged particle beam system Anthony Graupera, N. William Parker 2014-06-24
8692217 Multi-source plasma focused ion beam system Noel Smith, Clive D. Chandler, Paul P. Tesch, Dave Tuggle 2014-04-08
8642974 Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolation Sean Kellogg, Andrew B. Wells, James B. McGinn, N. William Parker, Anthony Graupera 2014-02-04
8633452 Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Anthony Graupera, Sean Kellogg, N. William Parker 2014-01-21
8629416 Charged particle beam masking for laser ablation micromachining Marcus Straw, Milos Toth, Steven Randolph, Michael J. Lysaght 2014-01-14
8405054 Multi-source plasma focused ion beam system Noel Smith, Clive D. Chandler, Paul P. Tesch, Dave Tuggle 2013-03-26
8319181 System and method for localization of large numbers of fluorescent markers in biological samples N. William Parker 2012-11-27