Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154757 | Automated ion-beam alignment for dual-beam instrument | — | 2024-11-26 |
| 12148296 | Sensor optimization | Helen Elizabeth Kourous-Harrigan, William Buller, Susan Janiszewski, Colin Brooks | 2024-11-19 |
| 10763079 | Focused ion beam impurity identification | Lukas Kral | 2020-09-01 |
| 8907296 | Charged particle beam system aperture | N. William Parker, Mark W. Utlaut, David William Tuggle | 2014-12-09 |
| 8215364 | Ergonomic squeegee with blade for adhesions and detachment | — | 2012-07-10 |