NP

N. William Parker

FE Fei: 25 patents #8 of 681Top 2%
MS Multibeam Systems: 13 patents #1 of 11Top 10%
MU Multibeam: 4 patents #6 of 12Top 50%
TL Tokyo Electron Limited: 3 patents #2,069 of 5,567Top 40%
PT Plasma & Materials Technologies: 2 patents #4 of 9Top 45%
Motorola: 1 patents #6,475 of 12,470Top 55%
MO Motorla: 1 patents #1 of 49Top 3%
Overall (All Time): #56,650 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 25 most recent of 49 patents

Patent #TitleCo-InventorsDate
10366860 High aspect ratio X-ray targets and uses of same Mark W. Utlaut, Laurens Franz Taemsz Kwakman, Thomas G. Miller 2019-07-30
9972474 Electron microscope with multiple types of integrated x-ray detectors arranged in an array Cornelis van Beek, Frederick H. Schamber 2018-05-15
9934930 High aspect ratio x-ray targets and uses of same Mark W. Utlaut, Laurens Franz Taemsz Kwakman, Thomas G. Miller 2018-04-03
9767984 Chicane blanker assemblies for charged particle beam systems and methods of using the same Kevin Kagarice, Charles Otis 2017-09-19
9733164 Lamella creation method and device using fixed-angle beam and rotating sample stage Andrew B. Wells, Clive D. Chandler, Mark W. Utlaut 2017-08-15
9627174 Multi species ion source Gregory A. Schwind 2017-04-18
9591735 High voltage isolation of an inductively coupled plasma ion source with a liquid that is not actively pumped Sean Kellogg, Andrew B. Wells, James B. McGinn, Mark W. Utlaut 2017-03-07
9494516 System and method for simultaneous detection of secondary electrons and light in a charged particle beam system Mark W. Utlaut 2016-11-15
9478390 Integrated light optics and gas delivery in a charged particle lens Marcus Straw, Jorge Filevich, Aurelien Philippe Jean Maclou Botman, Steven Randolph, Clive D. Chandler +1 more 2016-10-25
9349564 Charged-particle lens that transmits emissions from sample Marcus Straw, Jorge Filevich 2016-05-24
9224569 Multi species ion source Gregory A. Schwind 2015-12-29
9204036 Image-enhancing spotlight mode for digital microscopy Alan Bahm, Mark W. Utlaut 2015-12-01
9159534 Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Anthony Graupera, Sean Kellogg, Mark W. Utlaut 2015-10-13
9111715 Charged particle energy filter Wesley Hughes 2015-08-18
9053895 System for attachment of an electrode into a plasma source Sean Kellogg, Anthony Graupera, Andrew B. Wells, Mark W. Utlaut, Walter Skoczylas +3 more 2015-06-09
9040909 System and method for simultaneous detection of secondary electrons and light in a charged particle beam system Mark W. Utlaut 2015-05-26
8987678 Encapsulation of electrodes in solid media Sean Kellogg, Mark W. Utlaut, Anthony Graupera 2015-03-24
8907296 Charged particle beam system aperture Mark W. Utlaut, David William Tuggle, Jeremy Graham 2014-12-09
8759764 On-axis detector for charged particle beam system Anthony Graupera, Mark W. Utlaut 2014-06-24
8710453 Charged particle source with multiple selectable particle emitters 2014-04-29
8678049 Method and structure for prevention of incorrect fueling operations for diesel-powered vehicles Curtis Roys 2014-03-25
8642974 Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolation Sean Kellogg, Andrew B. Wells, James B. McGinn, Mark W. Utlaut, Anthony Graupera 2014-02-04
8633452 Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Anthony Graupera, Sean Kellogg, Mark W. Utlaut 2014-01-21
8319181 System and method for localization of large numbers of fluorescent markers in biological samples Mark W. Utlaut 2012-11-27
8314410 Combination laser and charged particle beam system Marcus Straw, Mark W. Utlaut 2012-11-20