Cornelis van Beek — 8 Patents at Fei

Cornelis van Beek has been granted 8 US patents while listed as an inventor at Fei. The first was granted in 2004 and the most recent in March 2024. Cornelis van Beek ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Cornelis van Beek in Pittsburgh, PA, US.

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11921053	Methods and systems for inclusion analysis	Jean-Marc Bohlen	2024-03-05
11150197	Methods and systems for inclusion analysis	Jean-Marc Bohlen	2021-10-19
9972474	Electron microscope with multiple types of integrated x-ray detectors arranged in an array	Frederick H. Schamber, N. William Parker	2018-05-15
8987665	Electron microscope with integrated detector(s)	Frederick H. Schamber	2015-03-24	$9,817,000
RE44035	Apparatus for correlating an optical image and a SEM image and method of use thereof	Frederick H. Schamber, Nicholas Ritchie	2013-03-05
8334511	Electron microscope with integrated detector(s)	Frederick H. Schamber	2012-12-18	$6,773,000
7476858	Particle detection auditing system and method	Frederick H. Schamber	2009-01-13
6683316	Apparatus for correlating an optical image and a SEM image and method of use thereof	Frederick H. Schamber, Nicholas Ritchie	2004-01-27

Cornelis van Beek — 8 Patents

Issued Patents All Time

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