Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921053 | Methods and systems for inclusion analysis | Jean-Marc Bohlen | 2024-03-05 |
| 11150197 | Methods and systems for inclusion analysis | Jean-Marc Bohlen | 2021-10-19 |
| 9972474 | Electron microscope with multiple types of integrated x-ray detectors arranged in an array | Frederick H. Schamber, N. William Parker | 2018-05-15 |
| 8987665 | Electron microscope with integrated detector(s) | Frederick H. Schamber | 2015-03-24 |
| RE44035 | Apparatus for correlating an optical image and a SEM image and method of use thereof | Frederick H. Schamber, Nicholas Ritchie | 2013-03-05 |
| 8334511 | Electron microscope with integrated detector(s) | Frederick H. Schamber | 2012-12-18 |
| 7476858 | Particle detection auditing system and method | Frederick H. Schamber | 2009-01-13 |
| 6683316 | Apparatus for correlating an optical image and a SEM image and method of use thereof | Frederick H. Schamber, Nicholas Ritchie | 2004-01-27 |