FS

Frederick H. Schamber

FE Fei: 4 patents #139 of 681Top 25%
AG Aspex Group: 2 patents #2 of 7Top 30%
RG Rj Lee Group: 2 patents #6 of 46Top 15%
Overall (All Time): #568,090 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9972474 Electron microscope with multiple types of integrated x-ray detectors arranged in an array Cornelis van Beek, N. William Parker 2018-05-15
8987665 Electron microscope with integrated detector(s) Cornelis van Beek 2015-03-24
RE44035 Apparatus for correlating an optical image and a SEM image and method of use thereof Cornelis van Beek, Nicholas Ritchie 2013-03-05
8334511 Electron microscope with integrated detector(s) Cornelis van Beek 2012-12-18
7476858 Particle detection auditing system and method Cornelis van Beek 2009-01-13
6683316 Apparatus for correlating an optical image and a SEM image and method of use thereof Cornelis van Beek, Nicholas Ritchie 2004-01-27
5376792 Scanning electron microscope Raymond E. Turocy 1994-12-27
5376799 Turbo-pumped scanning electron microscope Fred C. Schwerer, Albert H. Beebe, Richard J. Lee 1994-12-27
4288692 Beam current normalization in an X-ray microanalysis instrument Jon J. McCarthy 1981-09-08