MT

Milos Toth

FE Fei: 27 patents #5 of 681Top 1%
Overall (All Time): #136,563 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 25 most recent of 28 patents

Patent #TitleCo-InventorsDate
12061159 Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams Daniel Totonjian, Aurelien Philippe Jean Maclou Botman 2024-08-13
11377740 Nanofabrication using a new class of electron beam induced surface processing techniques James Bishop, Toan Trong Tran, Igor Aharonovich, Charlene Lobo 2022-07-05
11152189 Method and system for plasma assisted low vacuum charged-particle microscopy James Bishop, Daniel Totonjian, Chris Elbadawi, Charlene Lobo 2021-10-19
10777383 Method for alignment of a light beam to a charged particle beam Cameron James Zachreson, Dolf Timmerman, Jorge Filevich, Steven Randolph, Aurelien Philippe Jean Maclou Botman 2020-09-15
10538844 Nanofabrication using a new class of electron beam induced surface processing techniques James Bishop, Toan Trong Tran, Igor Aharonovich, Charlene Lobo 2020-01-21
10501851 Attachment of nano-objects to beam-deposited structures Mehran Kianinia, Olga Shimoni, Igor Aharonovich, Charlene Lobo, Steven Randolph +1 more 2019-12-10
10493559 Method and apparatus for laser machining Marcus Straw, David H. Narum, Mark W. Utlaut, Guido Knippels, Gerardus N. A. Van Veen 2019-12-03
10304658 Electron beam-induced etching Aiden Martin 2019-05-28
9951417 Method of depositing material Aurelien Philippe Jean Maclou Botman, Steven Randolph 2018-04-24
9812286 Localized, in-vacuum modification of small structures David H. Narum, Steven Randolph, Aurelien Philippe Jean Maclou Botman 2017-11-07
9799490 Charged particle beam processing using process gas and cooled surface Aiden Martin, Geoff McCredie 2017-10-24
9679741 Environmental cell for charged particle beam system Libor Novak, Marek Uncovsky, Martin Cafourek, William Parker, Marcus Straw +1 more 2017-06-13
9633816 Electron beam microscope with improved imaging gas and method of use Toby Shanley, John Scott 2017-04-25
9255339 Localized, in-vacuum modification of small structures Aurelien Philippe Jean Maclou Botman, Steven Randolph, David H. Narum 2016-02-09
9123506 Electron beam-induced etching Aiden Martin 2015-09-01
8921811 High pressure charged particle beam system William Ralph Knowles 2014-12-30
8853078 Method of depositing material Aurelien Philippe Jean Maclou Botman, Steven Randolph 2014-10-07
8853592 Method for laser machining a sample having a crystalline structure Marcus Straw, Amin Samsavar, Mark W. Utlaut 2014-10-07
8629416 Charged particle beam masking for laser ablation micromachining Marcus Straw, Steven Randolph, Michael J. Lysaght, Mark W. Utlaut 2014-01-14
8617668 Method of using nitrogen based compounds to reduce contamination in beam-induced thin film deposition Charlene Lobo, Steven Randolph, Clive D. Chandler 2013-12-31
8598542 Charged particle beam processing Richard Young, Alexander Henstra, Alan Frank de Jong, Johannes Jacobus Lambertus Mulders 2013-12-03
8524139 Gas-assisted laser ablation Marcus Straw 2013-09-03
8357894 Microcalorimetry for X-ray spectroscopy Michael R. Scheinfein, Eric H. Silver, David H. Narum 2013-01-22
8303833 High resolution plasma etch Noel Smith 2012-11-06
8299432 Scanning transmission electron microscope using gas amplification William Ralph Knowles 2012-10-30