| 8884245 |
Corrector for the correction of chromatic aberrations in a particle-optical apparatus |
Alexander Henstra |
2014-11-11 |
| 8357894 |
Microcalorimetry for X-ray spectroscopy |
Milos Toth, Eric H. Silver, David H. Narum |
2013-01-22 |
| 7504623 |
Device and method for milling of material using ions |
Paul E. Fischione, David W. Smith, Joseph M. Matesa, Thomas C. Swihart, III, David Martin |
2009-03-17 |
| 7372195 |
Electron beam source having an extraction electrode provided with a magnetic disk element |
Steven Thomas Coyle, William J. DeVore |
2008-05-13 |
| 7132673 |
Device and method for milling of material using ions |
Paul E. Fischione, David W. Smith, Joseph M. Matesa, Thomas C. Swihart, III, David Martin |
2006-11-07 |
| 6946654 |
Collection of secondary electrons through the objective lens of a scanning electron microscope |
Robert L. Gerlach, Karel Diederick Van Der Mast |
2005-09-20 |
| 6900447 |
Focused ion beam system with coaxial scanning electron microscope |
Robert L. Gerlach, Mark W. Utlaut |
2005-05-31 |
