JB

James Bishop

FE Fei: 3 patents #184 of 681Top 30%
MS Measurement Specialties: 1 patents #43 of 94Top 50%
TG Te Connectivity Sensors Germany Gmbh: 1 patents #9 of 17Top 55%
University of California: 1 patents #8,022 of 18,278Top 45%
Overall (All Time): #817,427 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11377740 Nanofabrication using a new class of electron beam induced surface processing techniques Toan Trong Tran, Igor Aharonovich, Charlene Lobo, Milos Toth 2022-07-05
11169000 Multi-turn measurement system Armin Meisenberg, Scott Yankie 2021-11-09
11152189 Method and system for plasma assisted low vacuum charged-particle microscopy Daniel Totonjian, Chris Elbadawi, Charlene Lobo, Milos Toth 2021-10-19
10538844 Nanofabrication using a new class of electron beam induced surface processing techniques Toan Trong Tran, Igor Aharonovich, Charlene Lobo, Milos Toth 2020-01-21
8717564 Optical sedimentation recorder 2014-05-06
7030981 Method and apparatus for measuring birefringent particles Christopher K. Guay 2006-04-18