Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646263 | Method of X-ray analysis in a particle-optical apparatus | Laurens Franz Taemsz Kwakman | 2003-11-11 |
| 5578822 | Particle-optical apparatus comprising a detector for secondary electrons | Karel Diederick Van Der Mast, Pieter Kruit, Alexander Henstra | 1996-11-26 |
| 5510617 | Particle-optical instrument comprising a deflection unit for secondary electrons | Alexander Henstra | 1996-04-23 |