Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211223 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Stefano Vespucci, Eric Gerardus Theodoor Bosch, Bert Henning Freitag | 2021-12-28 |
| 10699872 | Discriminative imaging technique in scanning transmission charged particle microscopy | Eric Gerardus Theodoor Bosch, Robert Imlau | 2020-06-30 |
| 10665419 | Intelligent pre-scan in scanning transmission charged particle microscopy | Erik Franken, Bart Jozef Janssen | 2020-05-26 |
| 10607811 | Multi-beam scanning transmission charged particle microscope | Ali Mohammadi-Gheidari, Eric Gerardus Theodoor Bosch, Gerard Nicolaas Anne van Veen | 2020-03-31 |
| 10573488 | Method of performing tomographic imaging in a charged-particle microscope | Eric Gerardus Theodoor Bosch | 2020-02-25 |
| 10446366 | Imaging technique in scanning transmission charged particle microscopy | Eric Gerardus Theodoor Bosch | 2019-10-15 |
| 10403469 | Method of performing tomographic imaging in a charged-particle microscope | Eric Gerardus Theodoor Bosch | 2019-09-03 |
| 9959639 | Method of ptychographic imaging | Eric Gerardus Theodoor Bosch | 2018-05-01 |
| 9312098 | Method of examining a sample in a charged-particle microscope | Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar | 2016-04-12 |
| 9202670 | Method of investigating the wavefront of a charged-particle beam | Bart Jozef Janssen, Gijs van Duinen, Uwe Luecken, Ross Savage, Stephanus H.L. van den Boom | 2015-12-01 |
| 9136087 | Method of investigating and correcting aberrations in a charged-particle lens system | Gijs van Duinen, Peter Christiaan Tiemeijer | 2015-09-15 |
| 8766214 | Method of preparing and imaging a lamella in a particle-optical apparatus | Brian Roberts Routh, Jr., Peter Christiaan Tiemeijer, Bart Jozef Janssen, Thomas G. Miller, David Foord | 2014-07-01 |