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USPTO Patent Rankings Data through Dec 31, 2025
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Ivan Lazic — 12 Patents

FEFei: 12 patents #41 of 681Top 7%
Eindhoven, NL: #666 of 8,225 inventorsTop 9%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Ivan Lazic has been granted 12 US patents while listed as an inventor at Fei. The first was granted in 2014 and the most recent in December 2021. Ivan Lazic ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Ivan Lazic in Eindhoven, NL.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11211223 System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy Stefano Vespucci, Eric Gerardus Theodoor Bosch, Bert Henning Freitag 2021-12-28
10699872 Discriminative imaging technique in scanning transmission charged particle microscopy Eric Gerardus Theodoor Bosch, Robert Imlau 2020-06-30
10665419 Intelligent pre-scan in scanning transmission charged particle microscopy Erik Franken, Bart Jozef Janssen 2020-05-26
10607811 Multi-beam scanning transmission charged particle microscope Ali Mohammadi-Gheidari, Eric Gerardus Theodoor Bosch, Gerard Nicolaas Anne van Veen 2020-03-31
10573488 Method of performing tomographic imaging in a charged-particle microscope Eric Gerardus Theodoor Bosch 2020-02-25
10446366 Imaging technique in scanning transmission charged particle microscopy Eric Gerardus Theodoor Bosch 2019-10-15 $3,456,000
10403469 Method of performing tomographic imaging in a charged-particle microscope Eric Gerardus Theodoor Bosch 2019-09-03 $1,358,000
9959639 Method of ptychographic imaging Eric Gerardus Theodoor Bosch 2018-05-01
9312098 Method of examining a sample in a charged-particle microscope Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar 2016-04-12 $20,246,000
9202670 Method of investigating the wavefront of a charged-particle beam Bart Jozef Janssen, Gijs van Duinen, Uwe Luecken, Ross Savage, Stephanus H.L. van den Boom 2015-12-01 $9,064,000
9136087 Method of investigating and correcting aberrations in a charged-particle lens system Gijs van Duinen, Peter Christiaan Tiemeijer 2015-09-15 $16,771,000
8766214 Method of preparing and imaging a lamella in a particle-optical apparatus Brian Roberts Routh, Jr., Peter Christiaan Tiemeijer, Bart Jozef Janssen, Thomas G. Miller, David Foord 2014-07-01 $9,789,000