Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394587 | Simple spherical aberration corrector for SEM | Alexander Henstra, Luigi Mele | 2025-08-19 |
| 12362132 | Simple spherical aberration corrector for SEM | Alexander Henstra | 2025-07-15 |
| 11961709 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Erik René Kieft, Pieter Kruit | 2024-04-16 |
| 11804357 | Electron optical module for providing an off-axial electron beam with a tunable coma | Peter Christiaan Tiemeijer, Alexander Henstra, Tomas Radlicka | 2023-10-31 |
| 11450505 | Magnetic field free sample plane for charged particle microscope | Alexander Henstra, Peter Christiaan Tiemeijer | 2022-09-20 |
| 10971326 | Multi-electron-beam imaging apparatus with improved performance | Peter Christiaan Tiemeijer, Erik René Kieft, Gerard Nicolaas Anne van Veen | 2021-04-06 |
| 10790113 | Multi-beam charged particle imaging apparatus | Bohuslav Sed'a, Marek Un{hacek over (c)}ovský | 2020-09-29 |
| 10607811 | Multi-beam scanning transmission charged particle microscope | Ivan Lazic, Eric Gerardus Theodoor Bosch, Gerard Nicolaas Anne van Veen | 2020-03-31 |
| 10453647 | Emission noise correction of a charged particle source | Luigi Mele, Peter Christiaan Tiemeijer, Gerard Nicolaas Anne van Veen, Hendrik Nicolaas Slingerland | 2019-10-22 |
| 10410827 | Gun lens design in a charged particle microscope | Alexander Henstra, Peter Christiaan Tiemeijer, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more | 2019-09-10 |
| 9697985 | Apparatus and method for inspecting a surface of a sample | Pieter Kruit, Yan Ren | 2017-07-04 |