Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961709 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Ali Mohammadi-Gheidari, Pieter Kruit | 2024-04-16 |
| 11551906 | Time-gated detection, dual-layer SPAD-based electron detection | Bart Jozef Janssen, Gerard Nicolaas Anne van Veen | 2023-01-10 |
| 11328892 | Coating on dielectric insert of a resonant RF cavity | Pleun Dona, Jasper Frans Mathijs VAN RENS, Wouter Verhoeven, Peter Mutsaers, Jom Luiten +1 more | 2022-05-10 |
| 11282670 | Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images | Pavel Potocek, Luká{hacek over (s)} Hübner, Milo{hacek over (s)} Hovorka | 2022-03-22 |
| 11127562 | System and method for RF pulsed electron beam based STEM | Bert Henning Freitag | 2021-09-21 |
| 11116940 | X-ray imaging system for a catheter | Daniel Simon Anna Ruijters, Sander Hans Denissen, Michael Grass, Erik Martinus Hubertus Petrus Van Dijk, Dirk Dijkkamp +2 more | 2021-09-14 |
| 11114272 | Pulsed CFE electron source with fast blanker for ultrafast TEM applications | Kun Liu | 2021-09-07 |
| 10971326 | Multi-electron-beam imaging apparatus with improved performance | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Gerard Nicolaas Anne van Veen | 2021-04-06 |
| 10825648 | Studying dynamic specimens in a transmission charged particle microscope | Bastiaan Lambertus Martinus Hendriksen | 2020-11-03 |
| 10340113 | Studying dynamic specimen behavior in a charged-particle microscope | Walter van Dijk | 2019-07-02 |
| 10039518 | ROI painting | — | 2018-08-07 |
| 10032599 | Time-resolved charged particle microscopy | — | 2018-07-24 |
| 9984852 | Time-of-flight charged particle spectroscopy | Otger Jan Luiten, Petrus Henricus Antonius Mutsaers, Jasper Frans Mathijs VAN RENS, Wouter Verhoeven | 2018-05-29 |
| 9724052 | Doctor aware automatic collimation | Bart Pierre Antoine Jozef Hoornaert | 2017-08-08 |
| 9048060 | Beam pulsing device for use in charged-particle microscopy | Fredericus Bernardus Kiewiet, Adam Christopher Lassise, Otger Jan Luiten, Petrus Henricus Antonius Mutsaers, Edgar Jan Dirk Vredenbregt +1 more | 2015-06-02 |
| 8446502 | Time domain multiplexing for imaging using time delay and integration sensors | — | 2013-05-21 |
| 7528395 | Radiation source, lithographic apparatus and device manufacturing method | Konstantin Nikolaevitch Koshelev, Vadim Yevgenyevich Banine, Vladimir Vital'evitch Ivanov, Erik Roelof Loopstra, Lucas Henricus Johannes Stevens +5 more | 2009-05-05 |