Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Artificial intelligence enabled metrology

Artificial intelligence enabled metrology

US Patent 12293525 · Granted May 6, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated sample alignment for microscopy2025
Microscopy feedback for improved milling accuracy2025
Artificial intelligence-enabled preparation end-pointing2023
Artificial intelligence-enabled preparation end-pointing2023
Artificial intelligence-enabled preparation end-pointing2023
Method of material deposition2023
Parameter estimation for metrology of features in an image2023
Parameter estimation for metrology of features in an image2023
Line-based endpoint detection2022
Dose-based end-pointing for low-kV FIB milling in TEM sample preparation2022
Artificial intelligence-enabled preparation end-pointing2021
Artificial intelligence-enabled preparation end-pointing2021