BB

Bart Buijsse

FE Fei: 34 patents #4 of 681Top 1%
Philips: 1 patents #3,761 of 7,731Top 50%
Overall (All Time): #92,321 of 4,157,543Top 3%
36
Patents All Time

Issued Patents All Time

Showing 26–36 of 36 patents

Patent #TitleCo-InventorsDate
8633456 Method for centering an optical element in a TEM comprising a contrast enhancing element Peter Christiaan Tiemeijer, Martinus P. M. Bierhoff 2014-01-21
8309921 Compact scanning electron microscope Martinus P. M. Bierhoff, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2012-11-13
8093558 Environmental cell for a particle-optical apparatus 2012-01-10
7906762 Compact scanning electron microscope MART PETRUS MARIA BIERHOFF, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2011-03-15
7456413 Apparatus for evacuating a sample Mark Meuwese, Maria Van Wely-Dieleman, Sjoerd Antonius Maria Mentink, Theodorus Hubertus Josephus Bisschops 2008-11-25
7317515 Method of localizing fluorescent markers Robert Hendriks 2008-01-08
7301157 Cluster tool for microscopic processing of samples Mark Meuwese, Bernardus Jacobus Marie Bormans, Hendrik Nicolaas Slingerland, Hendrik Gezinus Tappel 2007-11-27
7285785 Apparatus with permanent magnetic lenses Theodorus Hubertus Josephus Bisschops, Mark Meuwese 2007-10-23
7173999 X-ray microscope having an X-ray source for soft X-ray 2007-02-06
7067820 Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens 2006-06-27
7064325 Apparatus with permanent magnetic lenses Theodorus Hubertus Josephus Bisschops, Mark Meuwese 2006-06-20