Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601310 | Charged particle microscope with barometric pressure correction | Albert Visscher | 2017-03-21 |
| 8835846 | Imaging a sample in a TEM equipped with a phase plate | Bart Buijsse, Radostin Stoyanov Danev | 2014-09-16 |
| 6897947 | Method of measuring aberration in an optical imaging system | Hans Van Der Laan | 2005-05-24 |
| 6862076 | Method of determining stray radiation lithographic projection apparatus | Heine Melle Mulder | 2005-03-01 |
| 6819405 | Lithographic apparatus, device manufacturing method, and device manufactured thereby | Johannes Catharinus Hubertus Mulkens | 2004-11-16 |
| 6650399 | Lithographic projection apparatus, a grating module, a sensor module, a method of measuring wave front aberrations | Johannes Jacobus Matheus Baselmans, Hans Van Der Laan, Robert Wilhelm Willekers, Wilhelmus Petrus De Boeij, Marcus Adrianus Van De Kerkhof | 2003-11-18 |
| 6646729 | Method of measuring aberration in an optical imaging system | Hans Van Der Laan | 2003-11-11 |