Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971372 | Method of examining a sample using a charged particle microscope | Tomá{hacek over (s)} Tůma, Ji{hacek over (r)}í Pet{hacek over (r)}ek | 2024-04-30 |
| 11815479 | Method of examining a sample using a charged particle beam apparatus | Oleksii Kaplenko, Ond{hacek over (r)}ej Machek, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Kristýna Bukvi{hacek over (s)}ová, Mykola Kaplenko | 2023-11-14 |
| 11703468 | Method and system for determining sample composition from spectral data | Oleksii Kaplenko, Tomá{hacek over (s)} Tůma, Mykola Kaplenko, Ond{hacek over (r)}ej Machek | 2023-07-18 |
| 11598733 | Method of examining a sample using a charged particle microscope | Tomas Tuma, Jiri Petrek | 2023-03-07 |
| 11519871 | Method of examining a sample using a charged particle microscope | Tomá{hacek over (s)} Tůma, Ji{hacek over (r)}í Pet{hacek over (r)}ek | 2022-12-06 |
| 11327032 | Method of examining a sample using a charged particle microscope | Tomá{hacek over (s)} Tůma | 2022-05-10 |