Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971372 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek, Ji{hacek over (r)}í Pet{hacek over (r)}ek | 2024-04-30 |
| 11703468 | Method and system for determining sample composition from spectral data | Oleksii Kaplenko, Jan Klusá{hacek over (c)}ek, Mykola Kaplenko, Ond{hacek over (r)}ej Machek | 2023-07-18 |
| 11519871 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek, Ji{hacek over (r)}í Pet{hacek over (r)}ek | 2022-12-06 |
| 11327032 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek | 2022-05-10 |