Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971372 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek, Tomá{hacek over (s)} Tůma | 2024-04-30 |
| 11519871 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek, Tomá{hacek over (s)} Tůma | 2022-12-06 |