Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9070533 | Environmental scanning electron microscope (ESEM/SEM) gas injection apparatus with anode integrated with gas concentrating structure | Marc Castagna, Clive D. Chandler, Wayne Kurowski | 2015-06-30 |
| 8698078 | Charged-particle microscopy with occlusion detection | Faysal Boughorbel | 2014-04-15 |
| 8389936 | Method for inspecting a sample | Bert Henning Freitag, Georg Alexander Rosenthal | 2013-03-05 |
| 7442924 | Repetitive circumferential milling for sample preparation | Lucille A. Giannuzzi, Paul Anzalone, Richard Young | 2008-10-28 |