Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9048060 | Beam pulsing device for use in charged-particle microscopy | Erik René Kieft, Fredericus Bernardus Kiewiet, Adam Christopher Lassise, Otger Jan Luiten, Petrus Henricus Antonius Mutsaers +1 more | 2015-06-02 |
| 8884245 | Corrector for the correction of chromatic aberrations in a particle-optical apparatus | Michael R. Scheinfein | 2014-11-11 |
| 8841630 | Corrector for axial aberrations of a particle-optical lens | — | 2014-09-23 |
| 8710452 | Charged particle source with integrated electrostatic energy filter | — | 2014-04-29 |
| 8598542 | Charged particle beam processing | Milos Toth, Richard Young, Alan Frank de Jong, Johannes Jacobus Lambertus Mulders | 2013-12-03 |
| 8569693 | Distortion free stigmation of a TEM | Maarten Bischoff, Uwe Luecken, Peter Christiaan Tiemeijer | 2013-10-29 |
| 8461525 | Charged particle source with integrated energy filter | — | 2013-06-11 |
| 7999225 | Charged particle source with integrated energy filter | — | 2011-08-16 |
| 7378667 | Particle-optical appliance provided with aberration-correcting means | — | 2008-05-27 |
| 7034315 | Particle source with selectable beam current and energy spread | Jaroslav Chmelik | 2006-04-25 |
| 6455848 | Particle-optical apparatus involving detection of Auger electronics | Marcellinus Petrus Carolus Michael Krijn | 2002-09-24 |
| 6218664 | SEM provided with an electrostatic objective and an electrical scanning device | Jan Martijn Krans, Marcellinus Krijn | 2001-04-17 |
| 6184975 | Electrostatic device for correcting chromatic aberration in a particle-optical apparatus | Marcellinus Krijn | 2001-02-06 |
| 5986269 | Correction device for correcting chromatic aberration in particle-optical apparatus | Marcellinus P. C. M. Krijn, Karel Diederick Van Der Mast | 1999-11-16 |
| 5965894 | Method of operating a particle-optical apparatus | Marcellinus P. C. M. Krijn | 1999-10-12 |
| 5838011 | Correction device for the correction of lens aberrations in particle-optical apparatus | Marcellinus P. C. M. Krijn, Karel D. Van Den Mast | 1998-11-17 |
| 5578822 | Particle-optical apparatus comprising a detector for secondary electrons | Karel Diederick Van Der Mast, Pieter Kruit, Kars Z. Troost | 1996-11-26 |
| 5510617 | Particle-optical instrument comprising a deflection unit for secondary electrons | Kars Z. Troost | 1996-04-23 |