Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11810751 | Method of imaging a specimen using a transmission charged particle microscope | Peter Christiaan Tiemeijer, Evgeniia Pechnikova, Rudolf Geurink, Abhay Kotecha | 2023-11-07 |
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Gerard Nicolaas Anne van Veen +1 more | 2020-11-10 |