Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9978561 | Post column filter with enhanced energy range | Alexander Henstra | 2018-05-22 |
| 9934936 | Charged particle microscope with special aperture plate | Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers | 2018-04-03 |
| 9570270 | Method of using an environmental transmission electron microscope | Stan Johan Pieter Konings, Alexander Henstra | 2017-02-14 |
| 9524851 | Method of performing spectroscopy in a transmission charged-particle microscope | Erwin de Jong, Sorin Lazar, Rudolf Geurink | 2016-12-20 |
| 9136087 | Method of investigating and correcting aberrations in a charged-particle lens system | Ivan Lazic, Gijs van Duinen | 2015-09-15 |
| 8859966 | Simultaneous electron detection | Bert Henning Freitag, Sorin Lazar | 2014-10-14 |
| 8766214 | Method of preparing and imaging a lamella in a particle-optical apparatus | Brian Roberts Routh, Jr., Bart Jozef Janssen, Thomas G. Miller, David Foord, Ivan Lazic | 2014-07-01 |
| 8692196 | Method of use for a multipole detector for a transmission electron microscope | Uwe Luecken, Alan Frank de Jong, Hendrik Nicolaas Slingerland | 2014-04-08 |
| 8637821 | Blocking member for use in the diffraction plane of a TEM | Bart Buijsse | 2014-01-28 |
| 8633456 | Method for centering an optical element in a TEM comprising a contrast enhancing element | Bart Buijsse, Martinus P. M. Bierhoff | 2014-01-21 |
| 8569693 | Distortion free stigmation of a TEM | Maarten Bischoff, Alexander Henstra, Uwe Luecken | 2013-10-29 |
| 8405027 | Contrast for scanning confocal electron microscope | Sorin Lazar, Bert Henning Freitag | 2013-03-26 |
| 8071954 | Hybrid phase plate | Raymond Wagner, Hendrik Nicolaas Slingerland, Frank Jeroen Pieter Schuurmans | 2011-12-06 |
| 7915584 | TEM with aberration corrector and phase plate | Alan Frank de Jong | 2011-03-29 |
| 6693282 | Particle-optical apparatus including a particle source that can be switched between high brightness and large beam current | — | 2004-02-17 |
| 6593584 | Multi-beam lithography apparatus with mutually different beam limiting apertures | Jan Martijn Krans | 2003-07-15 |
| 6246058 | Correction device for correcting chromatic aberration in particle-optical apparatus | — | 2001-06-12 |
| 5838004 | Particle-optical apparatus comprising a fixed diaphragm for the monochromator filter | J. Chmelik, Pieter Kruit | 1998-11-17 |