DM

Diederik Jan Maas

AB Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
FE Fei: 2 patents #250 of 681Top 40%
CG Carl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
Overall (All Time): #483,304 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
12332574 Lithographic patterning method and system therefore Jacques Cor Johan Van Der Donck, Maarten Hubertus van Es, Chien-Ching Wu, Klara Maturova, Robert Wilhelm Willekers 2025-06-17
11977337 Lithographic patterning method Hamed Sadeghian Marnani, Emile van Veldhoven 2024-05-07
11549180 Apparatus and method for atomic layer deposition Bob Van Someren, Axel Sebastiaan Lexmond, Carolus Ida Maria Antonius Spee, Antonie Ellert Duisterwinkel, Adrianus Johannes Petrus Maria Vermeer 2023-01-10
10014165 Radiation sensor device for high energy photons Evert Nieuwkoop, Erwin John Van Zwet, Michel van Putten, Norbertus Benedictus Koster 2018-07-03
9567671 Method and apparatus for depositing atomic layers on a substrate Raymond Jacobus Wilhelmus Knaapen, Ruud Olieslagers, Dennis Van Den Berg, Matijs C. van den Boer, Jacques Cor Johan Van Der Donck +1 more 2017-02-14
8896809 Lithographic apparatus and device manufacturing method Judocus Marie Dominicus Stoeldraijer, Erik Roelof Loopstra, Jan Bernard Plechelmus Van Schoot 2014-11-25
8624185 Sample preparation Maria Rudneva, Emile van Veldhoven, Hendrik Willem Zandbergen 2014-01-07
8570489 Lithographic projection apparatus and method of compensating perturbation factors Jan Bernard Plechelmus Van Schoot, Antonius Johannes Josephus Van Dijsseldonk, Hans Van Der Laan 2013-10-29
7518121 Method for determining lens errors in a particle-optical device Sjoerd Antonius Maria Mentink, Jeroen Jan Lambertus Horikx, Bert Henning Freitag 2009-04-14
6693278 Particle-optical inspection device especially for semiconductor wafers Jan Martijn Krans 2004-02-17