Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345737 | Method, system and computer program for performing acoustic scanning probe microscopy | Daniele Piras, Paul Louis Maria Joseph VAN NEER, Benoit Andre Jacques QUESSON, Laurent Fillinger | 2025-07-01 |
| 12332574 | Lithographic patterning method and system therefore | Diederik Jan Maas, Jacques Cor Johan Van Der Donck, Chien-Ching Wu, Klara Maturova, Robert Wilhelm Willekers | 2025-06-17 |
| 12169187 | Method of and system for performing subsurface imaging using vibration sensing | Daniele Piras, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani | 2024-12-17 |
| 12130258 | Ultrasound sub-surface probe microscopy device and corresponding method | Paul Louis Maria Joseph VAN NEER, Kodai HATAKEYAMA, Benoit Andre Jacques QUESSON | 2024-10-29 |
| 11940416 | Heterodyne scanning probe microscopy method and system | Hamed Sadeghian Marnani, Paul Louis Maria Joseph VAN NEER, Rutger Meijer Timmerman Thijssen | 2024-03-26 |
| 11927564 | Cantilever, ultrasound acoustic microscopy device comprising the cantilever, method of using the same and lithographic system including the same | Abbas Mohtashami, Benoit Andre Jacques QUESSON, Paul Louis Maria Joseph VAN NEER | 2024-03-12 |
| 11644481 | Atomic force microscopy cantilever, system and method | Hamed Sadeghian Marnani | 2023-05-09 |
| 11635448 | Heterodyne scanning probe microscopy method and scanning probe microscopy system | Sri Ram Shankar Rajadurai, Daniele Piras, Kodai HATAKEYAMA, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani +1 more | 2023-04-25 |
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen, Martinus Cornelius Johannes Maria van Riel | 2022-08-02 |
| 11268935 | Method of and atomic force microscopy system for performing subsurface imaging | Daniele Piras, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani | 2022-03-08 |
| 11067597 | Method of performing atomic force microscopy with an ultrasound transducer | Martinus Cornelius Johannes Maria van Riel, Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani | 2021-07-20 |
| 11035878 | Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system | Laurent Fillinger, Paul Louis Maria Joseph VAN NEER, Daniele Piras, Marcus Johannes VAN DER LANS, Hamed Sadeghian Marnani | 2021-06-15 |
| 10976345 | Atomic force microscopy device, method and lithographic system | Abbas Mohtashami, Hamed Sadeghian Marnani | 2021-04-13 |
| 10948458 | Method of and system for performing detection on or characterization of a sample | Hamed Sadeghian Marnani, Lukas Kramer | 2021-03-16 |
| 10942200 | Heterodyne atomic force microscopy device, method and lithographic system | Abbas Mohtashami, Hamed Sadeghian Marnani | 2021-03-09 |
| 10935568 | Method of determining an overlay error, method for manufacturing a multilayer semiconductor device, atomic force microscopy device, lithographic system and semiconductor device | Hamed Sadeghian Marnani | 2021-03-02 |
| 10859925 | Method of and system for determining an overlay or alignment error between a first and a second device layer of a multilayer semiconductor device | Violeta Navarro Paredes, Hamed Sadeghian Marnani | 2020-12-08 |
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2020-09-15 |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2020-08-18 |
| 9897626 | Scanning probe microscope with a reduced Q-factor | Femke Chantal Tabak, Hamed Sadeghian Marnani | 2018-02-20 |