Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940416 | Heterodyne scanning probe microscopy method and system | Hamed Sadeghian Marnani, Maarten Hubertus van Es, Paul Louis Maria Joseph VAN NEER | 2024-03-26 |
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani, Martinus Cornelius Johannes Maria van Riel | 2022-08-02 |
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Hamed Sadeghian Marnani, Maarten Hubertus van Es | 2020-09-15 |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Hamed Sadeghian Marnani, Maarten Hubertus van Es | 2020-08-18 |