Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402405 | Frequency tracking for subsurface atomic force microscopy | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2022-08-02 |
| 11320454 | Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample | Hamed Sadeghian Marnani, Aukje Arianne Annette Kastelijn, Peter Martijn Toet, Geerten Frans Ijsbrand Kramer, Evert Nieuwkoop +2 more | 2022-05-03 |
| 11067597 | Method of performing atomic force microscopy with an ultrasound transducer | Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani, Maarten Hubertus van Es | 2021-07-20 |
| 11035879 | Z-position motion stage for use in a scanning probe microscopy system, scan head and method of manufacturing | Albert Dekker, Aukje Arianne Annette Kastelijin | 2021-06-15 |