Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345737 | Method, system and computer program for performing acoustic scanning probe microscopy | Paul Louis Maria Joseph VAN NEER, Benoit Andre Jacques QUESSON, Laurent Fillinger, Maarten Hubertus van Es | 2025-07-01 |
| 12345916 | Photonic integrated device for converting a light signal into sound via a solid photo-acoustic converter | Peter Johan Harmsma, Paul Louis Maria Joseph VAN NEER, Robert Karl Altmann, Maurits Sebastiaan Van Der Heiden | 2025-07-01 |
| 12313921 | Photonic integrated device for converting sound into a modulation of properties of light in the device | Maurits Sebastiaan Van Der Heiden, Paul Louis Maria Joseph VAN NEER, Peter Johan Harmsma, Robert Karl Altmann | 2025-05-27 |
| 12169187 | Method of and system for performing subsurface imaging using vibration sensing | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani | 2024-12-17 |
| 11635448 | Heterodyne scanning probe microscopy method and scanning probe microscopy system | Sri Ram Shankar Rajadurai, Kodai HATAKEYAMA, Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani +1 more | 2023-04-25 |
| 11327092 | Subsurface atomic force microscopy with guided ultrasound waves | Paul Louis Maria Joseph VAN NEER, Hamed Sadeghian Marnani | 2022-05-10 |
| 11268935 | Method of and atomic force microscopy system for performing subsurface imaging | Paul Louis Maria Joseph VAN NEER, Maarten Hubertus van Es, Hamed Sadeghian Marnani | 2022-03-08 |
| 11175165 | Acoustic measurement of a fluid flow | Paul Louis Maria Joseph VAN NEER, Uilke Stelwagen, Erwin Johannes Martinus Giling | 2021-11-16 |
| 11035878 | Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system | Laurent Fillinger, Paul Louis Maria Joseph VAN NEER, Marcus Johannes VAN DER LANS, Maarten Hubertus van Es, Hamed Sadeghian Marnani | 2021-06-15 |