BL

Berend Helmerus Lich

FE Fei: 6 patents #94 of 681Top 15%
📍 Weert, NL: #26 of 211 inventorsTop 15%
Overall (All Time): #845,287 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge 2017-07-18
9478393 Computational scanning microscopy with improved resolution Pavel Potocek, Faysal Boughorbel, Matthias Langhorst 2016-10-25
8704176 Charged particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge 2014-04-22
8586921 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Pavel Potocek, Cornelis Sander Kooijman 2013-11-19
8581189 Charged particle microscopy imaging method Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Cornelis Sander Kooijman, Alan Frank de Jong 2013-11-12
8232523 SEM imaging method Faysal Boughorbel, Cornelis Sander Kooijman, Eric Gerardus Theodoor Bosch 2012-07-31