Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10811216 | Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping | Stanislav Petras, Bohumila Lencova, Jon Karl Weiss | 2020-10-20 |
| 9991089 | Particle beam system and method for operating a particle optical unit | Ingo Mueller, Nicole Rauwolf, Christof Riedesel, Thomas Kemen, Joerg Jacobi +4 more | 2018-06-05 |
| 9799485 | Particle beam system and method for operating a particle optical unit | Ingo Mueller, Nicole Bengesser, Christof Riedesel, Thomas Kemen, Joerg Jacobi +4 more | 2017-10-24 |
| 9543115 | Electron microscope | Marko Matijevic | 2017-01-10 |
| 9349571 | Particle optical system | Thomas Kemen, Pascal Anger, Dirk Zeidler | 2016-05-24 |
| 8748819 | Transmission electron microscopy system and method of operating a transmission electron microscopy system | — | 2014-06-10 |
| 8598526 | Transmission electron microscope | — | 2013-12-03 |
| 8541739 | Precession diffraction charged particle beam system | Harald Niebel | 2013-09-24 |
| 8476589 | Particle beam microscope | Stefan Meyer, Steffen Niederberger, Dirk Preikszas | 2013-07-02 |
| 8471203 | Particle-beam microscope | Matthias Langer | 2013-06-25 |
| 8436302 | Phase-shifting element and particle beam device having a phase-shifting element | Rasmus Schröder, Bastian Barton, Harald Rose | 2013-05-07 |
| 8431894 | Electron beam device | Erik Essers, Volker Drexel | 2013-04-30 |
| 8330105 | Phase contrast electron microscope | Marko Matijevic | 2012-12-11 |
| 8299442 | Particle beam apparatus having an annularly-shaped illumination aperture | — | 2012-10-30 |
| 8173963 | Phase-shifting element and particle beam device having a phase-shifting element | Rasmus Schröder, Bastian Barton, Harald Rose | 2012-05-08 |
| 8039796 | Phase contrast electron microscope | Marko Matijevic | 2011-10-18 |
| 7902506 | Phase-shifting element and particle beam device having a phase-shifting element | Rasmus Schröder, Bastian Barton, Harald Rose | 2011-03-08 |
| 7741602 | Phase contrast electron microscope | Marko Matijevic | 2010-06-22 |
| 7060978 | Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system | Volker Drexel, Johannes Bihr, Stephan Kujawa | 2006-06-13 |
| 6797956 | Electron microscope with annular illuminating aperture | — | 2004-09-28 |
| 6657211 | Process for electron beam lithography, and electron-optical lithography system | — | 2003-12-02 |
| 6531698 | Particle-optic illuminating and imaging system with a condenser-objective single field lens | — | 2003-03-11 |
| 6437353 | Particle-optical apparatus and process for the particle-optical production of microstructures | — | 2002-08-20 |
| 6040576 | Energy filter, particularly for an electron microscope | — | 2000-03-21 |
| 5519216 | Electron-optical imaging system having controllable elements | Josef Frey, Martin Ross-Messemer, Eugen Weimer | 1996-05-21 |