Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10811216 | Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping | Stanislav Petras, Bohumila Lencova, Gerd Benner | 2020-10-20 |
| 10636622 | Scanning transmission electron microscope | Petras Stanislav, Lencova Bohumila, Benner Gerd Ludwig | 2020-04-28 |
| 9406496 | Method and system for improving characteristic peak signals in analytical electron microscopy | Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiró Martinez, José Manuel Rebled Corsellas, Lluís Yedra Cardona +2 more | 2016-08-02 |
| 9274070 | System and process for measuring strain in materials at high spatial resolution | Amith D. Darbal, Raman D. Narayan, Steven Kim, Stavros Nicolopoulos | 2016-03-01 |