Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11480588 | Method for providing a probe device for scanning probe microscopy | — | 2022-10-25 |
| 8739310 | Characterization structure for an atomic force microscope tip | Johann Foucher | 2014-05-27 |
| 8723138 | Electron beam source and method of manufacturing the same | Volker Drexel, Ulrich Mantz, Christian Penzkofer | 2014-05-13 |
| 8209768 | Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip | Thomas Sulzbach, Oliver Krause, Mathieu Burri, Manfred Detterbeck, Christian Penzkofer | 2012-06-26 |
| 8164071 | Electron beam source and method of manufacturing the same | Volker Drexel, Ulrich Mantz, Christian Penzkofer | 2012-04-24 |