Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359994 | Computer system for processing heterogeneous measurements from various metrology apparatuses with a view to estimating values of features of microelectronic devices, corresponding method and computer program | Jerome Hazart | 2019-07-23 |
| 9646804 | Method for calibration of a CD-SEM characterisation technique | Jerome Hazart | 2017-05-09 |
| 8739310 | Characterization structure for an atomic force microscope tip | Bernd Irmer | 2014-05-27 |
| 8723116 | Method of determining an applicable threshold for determining the critical dimension of at least one category of patterns imaged by atomic force scanning electron microscopy | Mazan Saied | 2014-05-13 |
| 8443460 | Method and structure for characterising an atomic force microscopy tip | Pascal Faurie | 2013-05-14 |
| 6818488 | Process for making a gate for a short channel CMOS transistor structure | Olivier Joubert, Giles Cunge, David Fuard, Marceline Bonvalot, Laurent Vallier | 2004-11-16 |