PF

Pascal Faurie

CEA: 1 patents #3,381 of 7,956Top 45%
📍 Saint-Égrève, FR: #263 of 471 inventorsTop 60%
Overall (All Time): #3,159,428 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8443460 Method and structure for characterising an atomic force microscopy tip Johann Foucher 2013-05-14