CP

Christian Penzkofer

CG Carl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
CG Carl Zeiss Nts Gmbh: 1 patents #39 of 103Top 40%
NA Nanoworld Ag: 1 patents #7 of 17Top 45%
📍 Birkenfeld, DE: #390 of 1,442 inventorsTop 30%
Overall (All Time): #1,530,721 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8723138 Electron beam source and method of manufacturing the same Volker Drexel, Ulrich Mantz, Bernd Irmer 2014-05-13
8209768 Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip Thomas Sulzbach, Oliver Krause, Mathieu Burri, Manfred Detterbeck, Bernd Irmer 2012-06-26
8164071 Electron beam source and method of manufacturing the same Volker Drexel, Ulrich Mantz, Bernd Irmer 2012-04-24