Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10340114 | Method of eliminating thermally induced beam drift in an electron beam separator | Sameet K. Shriyan, Oscar G. Florendo, Joseph Maurino | 2019-07-02 |
| 9934933 | Extractor electrode for electron source | Laurence S. Hordon, Nikolai Chubun, Luca Grella, Xinrong Jiang, Kevin Cummings +2 more | 2018-04-03 |
| 6252705 | Stage for charged particle microscopy system | Chiwoei Wayne Lo | 2001-06-26 |
| 5517033 | Apparatus for improved image resolution in electron microscopy | Ondrej L. Krivanek, Paul Mooney | 1996-05-14 |