Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840056 | Multi-column scanning electron microscopy system | Aron Welk, Tomas Plettner, John Gerling, Mehran Nasser Ghodsi | 2020-11-17 |
| 10777377 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Frank Chilese, Moshe E. Preil | 2020-09-15 |
| 10438769 | Array-based characterization tool | Alex Lipkind, Alon Rosenthal, Frank Chilese, John Gerling, Lawrence P. Muray | 2019-10-08 |
| 10354832 | Multi-column scanning electron microscopy system | John Gerling, Aron Welk, Christopher Sears, Felipe Fuks, Mehran Nasser-Ghodsi +1 more | 2019-07-16 |
| 9591770 | Multi-layer ceramic vacuum to atmosphere electric feed through | Mehran Nasser-Ghodsi | 2017-03-07 |
| 9513230 | Apparatus and method for optical inspection, magnetic field and height mapping | John Gerling, Edward Wagner, Mehran Nasser-Ghodsi, Garrett Pickard, Tomas Plettner +1 more | 2016-12-06 |
| 8633457 | Background reduction system including louver | Mehran Nasser-Ghodsi, Christopher Sears | 2014-01-21 |
| 8618513 | Apparatus and methods for forming an electrical conduction path through an insulating layer | Tomas Plettner, Mehran Nasser-Ghodsi, Rudy F. Garcia | 2013-12-31 |
| 8513619 | Non-planar extractor structure for electron source | Mehran Nasser-Ghodsi, Tomas Plettner, Christopher Sears | 2013-08-20 |
| 8455838 | Multiple-column electron beam apparatus and methods | Khashayar Shadman, Christopher Sears, Mehran Nasser-Ghodsi | 2013-06-04 |
| 8421030 | Charged-particle energy analyzer | Khashayar Shadman, Gabor Toth, Christopher Sears, Mehran Nasser Ghodsi | 2013-04-16 |
| 5549269 | Gas spring assembly | Maurice Gertel | 1996-08-27 |
| 5348266 | Reduced horizontal stiffness vibration isolation system | Maurice Gertel | 1994-09-20 |