| 10840056 |
Multi-column scanning electron microscopy system |
Aron Welk, Tomas Plettner, John Gerling, Mehran Nasser Ghodsi |
2020-11-17 |
| 10777377 |
Multi-column spacing for photomask and reticle inspection and wafer print check verification |
Frank Chilese, Moshe E. Preil |
2020-09-15 |
| 10438769 |
Array-based characterization tool |
Alex Lipkind, Alon Rosenthal, Frank Chilese, John Gerling, Lawrence P. Muray |
2019-10-08 |
| 10354832 |
Multi-column scanning electron microscopy system |
John Gerling, Aron Welk, Christopher Sears, Felipe Fuks, Mehran Nasser-Ghodsi +1 more |
2019-07-16 |
| 9591770 |
Multi-layer ceramic vacuum to atmosphere electric feed through |
Mehran Nasser-Ghodsi |
2017-03-07 |
| 9513230 |
Apparatus and method for optical inspection, magnetic field and height mapping |
John Gerling, Edward Wagner, Mehran Nasser-Ghodsi, Garrett Pickard, Tomas Plettner +1 more |
2016-12-06 |
| 8633457 |
Background reduction system including louver |
Mehran Nasser-Ghodsi, Christopher Sears |
2014-01-21 |
| 8618513 |
Apparatus and methods for forming an electrical conduction path through an insulating layer |
Tomas Plettner, Mehran Nasser-Ghodsi, Rudy F. Garcia |
2013-12-31 |
| 8513619 |
Non-planar extractor structure for electron source |
Mehran Nasser-Ghodsi, Tomas Plettner, Christopher Sears |
2013-08-20 |
| 8455838 |
Multiple-column electron beam apparatus and methods |
Khashayar Shadman, Christopher Sears, Mehran Nasser-Ghodsi |
2013-06-04 |
| 8421030 |
Charged-particle energy analyzer |
Khashayar Shadman, Gabor Toth, Christopher Sears, Mehran Nasser Ghodsi |
2013-04-16 |
| 5549269 |
Gas spring assembly |
Maurice Gertel |
1996-08-27 |
| 5348266 |
Reduced horizontal stiffness vibration isolation system |
Maurice Gertel |
1994-09-20 |