Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11120969 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, Rohit Bothra, Grace Hsiu-Ling Chen, Rainer Knippelmeyer | 2021-09-14 |
| 10770258 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Kaz, Wei Ye | 2020-09-08 |
| 10643819 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, Rohit Bothra, Grace Hsiu-Ling Chen, Rainer Knippelmeyer | 2020-05-05 |
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Kaz, Wei Ye | 2018-08-21 |
| 9805910 | Automated SEM nanoprobe tool | Christopher Sears | 2017-10-31 |