Issued Patents All Time
Showing 25 most recent of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12230818 | Voltage-reduced lithium battery and manufacturing method thereof | Changjun Yang, Jian Zhao, Pengfei Xiao, Wei Zhou, Guohao Xu +1 more | 2025-02-18 |
| 12125992 | 1.5V lithium battery and manufacturing method thereof | Changjun Yang, Jian Zhao, Pengfei Xiao, Wei Zhou, Guohao Xu +1 more | 2024-10-22 |
| 12086937 | Virtual reality-based derailment accident passenger comfort degree monitoring system and method | Liang Gao, Fengzhuang Tong, Jianhua Zhu, Hui Yin, Xiaopei CAI +3 more | 2024-09-10 |
| 12037333 | Pyridopyrazine and pyridotriazine inhibitors of influenza virus replication | Irina C. Jacobson, Biing Yuan Lin, Emiliano J. Sanchez, Sam SK Lee | 2024-07-16 |
| 11914290 | Overlay measurement targets design | — | 2024-02-27 |
| 11410830 | Defect inspection and review using transmissive current image of charged particle beam system | Lawrence P. Muray, Nick Petrone, John Gerling, Abdurrahman Sezginer, Alan D. Brodie +3 more | 2022-08-09 |
| 10948295 | Auto phase control drive circuit for gyroscope apparatus | Ronald J. Lipka | 2021-03-16 |
| 10823679 | Scanning type laser induced spectrum analysis and detection system | Tianzhuo Zhao, Fuqiang Lian, Zeqiang Mo, Weiran Lin, Yang Liu +3 more | 2020-11-03 |
| 10768533 | Method and system for generating programmed defects for use in metrology measurements | Nadav Gutman | 2020-09-08 |
| 10446367 | Scan strategies to minimize charging effects and radiation damage of charged particle beam metrology system | — | 2019-10-15 |
| 10020979 | Allocating resources in multi-core computing environments | Dennis Oshiba | 2018-07-10 |
| 10018579 | System and method for cathodoluminescence-based semiconductor wafer defect inspection | Sameet K. Shriyan, David Kaz | 2018-07-10 |
| 9831744 | Device for generating electricity | Jianfeng Yang, Conghua Jiang, Xiang Ao, Hu Zhou | 2017-11-28 |
| 9754761 | High-speed hotspot or defect imaging with a charged particle beam system | Christopher Maher | 2017-09-05 |
| 9734987 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Vivekanand Kini | 2017-08-15 |
| 9696268 | Automated decision-based energy-dispersive x-ray methodology and apparatus | Harsh Sinha, Dmitry Spivak, Huina Xu, Rohit Bothra | 2017-07-04 |
| 9449788 | Enhanced defect detection in electron beam inspection and review | Gary Fan, Kumar Raja Guvindan Raju, Wade Lenn Jensen, Lorraine Ellen Young | 2016-09-20 |
| 9318395 | Systems and methods for preparation of samples for sub-surface defect review | Cecelia Campochiaro, Michael J. Van Riet, Benjamin James Thomas Clarke, Harsh Sinha | 2016-04-19 |
| 9282293 | Method and system for measuring critical dimension and monitoring fabrication uniformity | Wei Fang, Jack Jau | 2016-03-08 |
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Vivekanand Kini | 2016-02-09 |
| 9153120 | Systems and methods for locating lost devices | Eric Zhao | 2015-10-06 |
| 9116109 | Method and apparatus for detecting buried defects | Ximan Jiang | 2015-08-25 |
| 9100553 | Method and system for measuring critical dimension and monitoring fabrication uniformity | Wei Fang, Jack Jau | 2015-08-04 |
| 9041795 | Method and system for measuring critical dimension and monitoring fabrication uniformity | Wei Fang, Jack Jau | 2015-05-26 |
| 9035674 | Structure and method for determining a defect in integrated circuit manufacturing process | Jack Jau, Chang-Chun Yeh | 2015-05-19 |