Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734987 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2017-08-15 |
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2016-02-09 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Sandeep Bhagwat, Michal Kowalski, David Randall +8 more | 2006-11-28 |