Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734987 | Method and system for adaptively scanning a sample during electron beam inspection | David Chen, Vivekanand Kini, Hong Xiao | 2017-08-15 |
| 9449788 | Enhanced defect detection in electron beam inspection and review | Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao, Lorraine Ellen Young | 2016-09-20 |
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | David Chen, Vivekanand Kini, Hong Xiao | 2016-02-09 |
| 5594253 | Hybrid luminescent device for imaging of ionizing and penetrating radiation | Clifford Bueno, Robert A. Betz, Mark H. Ellisman | 1997-01-14 |
| 5414261 | Enhanced imaging mode for transmission electron microscopy | Mark H. Ellisman, Jeff Price, Seiichi Suzuki | 1995-05-09 |