Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9449788 | Enhanced defect detection in electron beam inspection and review | Gary Fan, Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao | 2016-09-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9449788 | Enhanced defect detection in electron beam inspection and review | Gary Fan, Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao | 2016-09-20 |