Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387310 | Wafer signature local maxima via clustering for metrology guided inspection | Alan Davila, Marcus Liesching, Surya Vanamali, Suresh Selvaraj, Sravani Desu +3 more | 2025-08-12 |
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Ardis Liang, Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan | 2021-07-06 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Michal Kowalski, Vivekanand Kini, David Randall +8 more | 2006-11-28 |
| 7093207 | Data analysis flow engine | Po-Shou Liao, Benny Huang, Charles Lai, Jimmy Liao, Bing Li +8 more | 2006-08-15 |
| 6718526 | Spatial signature analysis | Peter Eldredge, Patrick Huet, Robinson Piramuthu, Kai-Chih Chi, Kai Liu +3 more | 2004-04-06 |