Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Sandeep Bhagwat, Michal Kowalski, Vivekanand Kini, David Randall +8 more | 2006-11-28 |
| 6718526 | Spatial signature analysis | Peter Eldredge, Patrick Huet, Robinson Piramuthu, Sandeep Bhagwat, Kai-Chih Chi +3 more | 2004-04-06 |