Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299848 | Deep learning image denoising for semiconductor-based applications | Aditya Gulati, Raghavan Konuru, Niveditha Lakshmi Narasimhan, Saravanan Paramasivam, Prasanti Uppaluri | 2025-05-13 |
| 12235224 | Process window qualification modulation layouts | Andrew Cross, Kaushik Sah | 2025-02-25 |
| 11676264 | System and method for determining defects using physics-based image perturbations | Saravanan Paramasivam, Jacob George, Niveditha Lakshmi Narasimhan, Sairam Ravu, Somesh Challapalli +1 more | 2023-06-13 |
| 11514357 | Nuisance mining for novel defect discovery | — | 2022-11-29 |
| 11379969 | Method for process monitoring with optical inspections | Prasanti Uppaluri, Saravanan Paramasivam | 2022-07-05 |
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sairam Ravu, Prasanti Uppaluri | 2022-07-05 |
| 11237119 | Diagnostic methods for the classifiers and the defects captured by optical tools | Erfan Soltanmohammadi, Saravanan Paramasivam, Sairam Ravu, Ankit Jain, Prasanti Uppaluri +1 more | 2022-02-01 |
| 11151707 | System and method for difference filter and aperture selection using shallow deep learning | Santosh Bhattacharyya, Jacob George, Saravanan Paramasivam | 2021-10-19 |
| 11119060 | Defect location accuracy using shape based grouping guided defect centering | Jagdish Chandra Saraswatula | 2021-09-14 |
| 11114324 | Defect candidate generation for inspection | Erfan Soltanmohammadi, Prasanti Uppaluri, Mohit Jani, Chris Maher | 2021-09-07 |
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Ardis Liang, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sandeep Bhagwat | 2021-07-06 |
| 10964013 | System, method for training and applying defect classifiers in wafers having deeply stacked layers | Ankit Jain | 2021-03-30 |
| 10902579 | Creating and tuning a classifier to capture more defects of interest during inspection | Erfan Soltanmohammadi, Tai-Kam Ng, Sang Hyun Lee | 2021-01-26 |
| 10832396 | And noise based care areas | Brian Duffy, Santosh Bhattacharyya, Gordon Rouse, Chris Maher, Erfan Soltanmohammadi | 2020-11-10 |
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Brian Duffy, Mike VonDenHoff, Andrew Cross, Kaushik Sah, Antonio Mani | 2020-06-30 |
| 10692690 | Care areas for improved electron beam defect detection | Vidyasagar Anantha, Arpit Yati, Saravanan Paramasivam, Jincheng Lin | 2020-06-23 |
| 10670536 | Mode selection for inspection | Saravanan Paramasivam, Ankit Jain, Prasanti Uppaluri, Raghavan Konuru | 2020-06-02 |
| 10436720 | Adaptive automatic defect classification | Li He, Huajun Ying, Anadi Bhatia, Amitoz Singh Dandiana, Ramakanth Ramini | 2019-10-08 |
| 10338004 | Production sample shaping that preserves re-normalizability | Ankit Jain, Michael Lennek | 2019-07-02 |
| 10267748 | Optimizing training sets used for setting up inspection-related algorithms | Erfan Soltanmohammadi, Saravanan Paramasivam, Sairam Ravu, Ankit Jain, Sarath Shekkizhar +1 more | 2019-04-23 |
| 9983148 | System and method for production line monitoring | Saravanan Paramasivam | 2018-05-29 |
| 9984454 | System, method and computer program product for correcting a difference image generated from a comparison of target and reference dies | — | 2018-05-29 |
| 9940705 | System, method and computer program product for detecting defects in a fabricated target component using consistent modulation for the target and reference components | Allen Park | 2018-04-10 |
| 9891538 | Adaptive sampling for process window determination | — | 2018-02-13 |
| 9835566 | Adaptive nuisance filter | Ardis Liang, Raghav Babulnath, Sankar Venkataraman | 2017-12-05 |