| 12299848 |
Deep learning image denoising for semiconductor-based applications |
Aditya Gulati, Raghavan Konuru, Niveditha Lakshmi Narasimhan, Saravanan Paramasivam, Martin Plihal |
2025-05-13 |
| 11676264 |
System and method for determining defects using physics-based image perturbations |
Martin Plihal, Saravanan Paramasivam, Jacob George, Niveditha Lakshmi Narasimhan, Sairam Ravu +1 more |
2023-06-13 |
| 11410291 |
System and method for generation of wafer inspection critical areas |
Rajesh Manepalli, Ashok Kulkarni, Saibal Banerjee, John Kirkland |
2022-08-09 |
| 11379967 |
Methods and systems for inspection of semiconductor structures with automatically generated defect features |
Jacob George, Saravanan Paramasivam, Martin Plihal, Niveditha Lakshmi Narasimhan, Sairam Ravu |
2022-07-05 |
| 11379969 |
Method for process monitoring with optical inspections |
Martin Plihal, Saravanan Paramasivam |
2022-07-05 |
| 11237119 |
Diagnostic methods for the classifiers and the defects captured by optical tools |
Martin Plihal, Erfan Soltanmohammadi, Saravanan Paramasivam, Sairam Ravu, Ankit Jain +1 more |
2022-02-01 |
| 11114324 |
Defect candidate generation for inspection |
Martin Plihal, Erfan Soltanmohammadi, Mohit Jani, Chris Maher |
2021-09-07 |
| 10706522 |
System and method for generation of wafer inspection critical areas |
Rajesh Manepalli, Ashok Kulkarni, Saibal Banerjee, John Kirkland |
2020-07-07 |
| 10670536 |
Mode selection for inspection |
Martin Plihal, Saravanan Paramasivam, Ankit Jain, Raghavan Konuru |
2020-06-02 |
| 10620134 |
Creating defect samples for array regions |
Vidyasagar Anantha, Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Satya Kurada +2 more |
2020-04-14 |
| 10267748 |
Optimizing training sets used for setting up inspection-related algorithms |
Martin Plihal, Erfan Soltanmohammadi, Saravanan Paramasivam, Sairam Ravu, Ankit Jain +1 more |
2019-04-23 |
| 10209628 |
System and method for defect classification based on electrical design intent |
Thirupurasundari Jayaraman, Ardis Liang, Srikanth Kandukuri, Sagar A. Kekare |
2019-02-19 |
| 8397194 |
Layout versus schematic error system and method |
Doug Den Dulk |
2013-03-12 |
| 8209656 |
Pattern decomposition method |
Xiaojun Wang, Yuane Qiu, Judy Huckabay, Tianhao Zhang |
2012-06-26 |
| 8181137 |
Layout versus schematic error system and method |
Doug Den Dulk |
2012-05-15 |