Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410291 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2022-08-09 |
| 10706522 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2020-07-07 |
| 10018571 | System and method for dynamic care area generation on an inspection tool | Vijayakumar Ramachandran, Ravikumar Sanapala, Vidyasagar Anantha, Philip Measor, Jing-Jing FANG | 2018-07-10 |