Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299848 | Deep learning image denoising for semiconductor-based applications | Aditya Gulati, Niveditha Lakshmi Narasimhan, Saravanan Paramasivam, Martin Plihal, Prasanti Uppaluri | 2025-05-13 |
| 10670536 | Mode selection for inspection | Martin Plihal, Saravanan Paramasivam, Ankit Jain, Prasanti Uppaluri | 2020-06-02 |
| 10204416 | Automatic deskew using design files or inspection images | Arpit Jain, Arpit Yati, Thirupurasundari Jayaraman, Raj Kuppa, Hema Prasad +2 more | 2019-02-12 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Raghav Babulnath +4 more | 2018-06-12 |
| 9613411 | Creating defect classifiers and nuisance filters | Naema Bhatti, Michael Lennek, Martin Plihal | 2017-04-04 |